PantaRhei

TEM optical stability benchmark

Registration email contact: pantarheitool@gmail.com.  

 

J. Barthel and A. Thust, Ultramicroscopy 111 (2010) 27–46 , “Aberration measurement in HRTEM: Implementation and diagnostic use of numerical procedures for the highly precise recognition of diffractogram patterns”.  

 

J. Barthel and A. Thust, Ultramicroscopy 134 (2013) 6–14 , “On the optical stability of high-resolution transmission electron microscopes”.