The ER-C houses conventional and state-of-the-art electron microscopes, ranging from standard scanning electron microscopes to highly-specialised aberration corrected instruments offering sub-Å resolution imaging and spectroscopy, as well as quantitative measurements of electromagnetic field distributions using phase contrast techniques that include off-axis electron holography and 4D STEM.
FEI Titan G3 50-300 PICO The FEI Titan G3 50-300 PICO is a unique fourth generation transmission electron microscope which has been specifically designed for the investigation of a wide…
One of the world’s most advanced DualBeamTM FIB platforms optimised for high throughput high-resolution S/TEM sample preparation, SEM imaging, process development and control…
The TFS Spectra 300 is a state-of-the-art FEG Scanning Transmission Electron Microscope (S/TEM) with a high-tension voltage range of 30 kV – 300 kV. Thanks to its specially designed enclosure it is not only possible to transfer information well below 1 Å resolution, it also allows the system to easily reach ultra-high resolution routinely in a noisier environment.
A highly advanced dual-beam FIB-SEM platform for imaging and analytical measurements, TEM sample and atom-probe needle preparation, process development and process control…