The ER-C houses conventional and state-of-the-art electron microscopes, ranging from standard scanning electron microscopes to highly-specialised aberration corrected instruments offering sub-Å resolution imaging and spectroscopy, as well as quantitative measurements of electromagnetic field distributions using phase contrast techniques that include off-axis electron holography and 4D STEM.
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FEI Titan G3 50-300 PICO
Technical Specifications Electron acceleration voltage 50 kV … 300 kV Electron beam current < 140 nA Information limit (TEM) @ 300 kV < 55 pm Information limit (TEM) @ 200…
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FEI Titan G2 60-300 HOLO
A fourth-generation transmission electron microscope specifically designed for off-axis electron holography. Equipped with a Lorentz lens and two electron biprisms…
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FEI Titan G2 80-200 ChemiSTEM
Fourth-generation Cs-probe corrected instrument with Super-X detector and dual EELS energy filter, allowing simultaneous EDX and EELS read-out of 1000 spectra per second…
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FEI Helios NanoLab 400S FIB-SEM
One of the world’s most advanced DualBeamTM FIB platforms optimised for high throughput high-resolution S/TEM sample preparation, SEM imaging, process development and control…
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Access
The ER-C provides both, direct services and scientific assistance to university research groups and research laboratories in industry and academia in the field of advanced electron microscopic applications. The support of students is also an integral part of our activities.
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FEI Helios NanoLab 460F1 FIB-SEM
A highly advanced dual-beam FIB-SEM platform for imaging and analytical measurements, TEM sample and atom-probe needle preparation, process development and process control…
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FEI Titan 80-300 STEM
Cs probe-corrected scanning transmission electron microscope equipped with a post-column energy filter, offering a STEM resolution of 80 pm at 300 kV…
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FEI Tecnai G2 F20
A versatile instrument for TEM or STEM imaging, equipped with post-column Gatan image filter, high-angle X-ray detector and a Nanomegas electron-precession system…
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FEI Titan 80-300 TEM
Cs-corrected high-resolution transmission electron microscope equipped with a piezo-stage for ultra-precise 3D specimen positioning and an information limit well below 100 pm…