
Facilities
The ER-C houses conventional and state-of-the-art electron microscopes, ranging from standard scanning electron microscopes to highly-specialised aberration corrected instruments offering sub-Å resolution imaging and spectroscopy, as well as quantitative measurements of electromagnetic field distributions using phase contrast techniques that include off-axis electron holography and 4D STEM.
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FEI Titan G3 50-300 PICO
FEI Titan G3 50-300 PICO The FEI Titan G3 50-300 PICO is a unique fourth generation transmission electron microscope which has been specifically designed for the investigation of a wide…
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FEI Titan G2 60-300 HOLO
A fourth-generation transmission electron microscope specifically designed for off-axis electron holography. Equipped with a Lorentz lens and two electron biprisms…
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FEI Titan G2 80-200 ChemiSTEM
Fourth-generation Cs-probe corrected instrument with Super-X detector and dual EELS energy filter, allowing simultaneous EDX and EELS read-out of 1000 spectra per second…
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FEI Helios NanoLab 400S FIB-SEM
One of the world’s most advanced DualBeamTM FIB platforms optimised for high throughput high-resolution S/TEM sample preparation, SEM imaging, process development and control…
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TFS Spectra 300
The TFS Spectra 300 is a state-of-the-art FEG Scanning Transmission Electron Microscope (S/TEM) with a high-tension voltage range of 30 kV – 300 kV. Thanks to its specially designed enclosure it is not only possible to transfer information well below 1 Å resolution, it also allows the system to easily reach ultra-high resolution routinely in a noisier environment.
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FEI Helios NanoLab 460F1 FIB-SEM
A highly advanced dual-beam FIB-SEM platform for imaging and analytical measurements, TEM sample and atom-probe needle preparation, process development and process control…
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FEI Titan 80-300 STEM
Cs probe-corrected scanning transmission electron microscope equipped with a post-column energy filter, offering a STEM resolution of 80 pm at 300 kV…
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FEI Tecnai G2 F20
A versatile instrument for TEM or STEM imaging, equipped with post-column Gatan image filter, high-angle X-ray detector and a Nanomegas electron-precession system…
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FEI Titan 80-300 TEM
Cs-corrected high-resolution transmission electron microscope equipped with a piezo-stage for ultra-precise 3D specimen positioning and an information limit well below 100 pm…