The ER-C houses conventional and state-of-the-art electron microscopes, ranging from standard scanning electron microscopes to highly-specialised aberration corrected instruments offering sub-Å resolution imaging and spectroscopy, as well as quantitative measurements of electromagnetic field distributions using phase contrast techniques that include off-axis electron holography and 4D STEM.
One of the world’s most advanced DualBeamTM FIB platforms optimised for high throughput high-resolution S/TEM sample preparation, SEM imaging, process development and control…
The ER-C provides both, direct services and scientific assistance to university research groups and research laboratories in industry and academia in the field of advanced electron microscopic applications. The support of students is also an integral part of our activities.
A highly advanced dual-beam FIB-SEM platform for imaging and analytical measurements, TEM sample and atom-probe needle preparation, process development and process control…