Sample Preparation

Specimen preparation for the transmission electron microscopy is an unavoidable and critical step for any TEM experiments. It is frequently a very challenging task, which may decide about the success or fail of arduously planned TEM experiment. All of the existing methods for the TEM-specimen preparation follow one common principle – the thinner, the better, which means that the thickness of the TEM-specimen ideally should not exceed 100 nm (10nm for HRTEM). Furthermore, a high quality ultra-thin TEM-specimen should not only reflect the material properties on the nm scale, but also have a homogeneous and clean surface to avoid the measurement artefacts.