PICO Conference Series
The PICO conference series on Frontiers of Aberration-corrected Electron Microscopy will be the latest in the series of biennial conferences focusing on fundamental electron optics and it’s applications to advanced transmission electron microscopy techniques being applied to the study of solid state research phenomena and the life sciences. The conference series primarily arose to satisfy the requirements of the electron microscopy community working on solid state problems at the atomic scale, which grew explosively in the early 2000’s with the introduction of aberration corrector units in commercial instruments and has expanded since to researchers working with analytical periphery, at low acceleration voltages or making use of various in-situ techniques.
PICO 20XX conferences are typically attended by about 150 to 180 participants and previous meetings have had 30 to 45 invited lecturers with about the same number of contributions from the wider scientific community having been scheduled for poster presentations. Proceedings of PICO 20XX conferences have been published as special issues in Ultramicroscopy in recent years.
|February 29th – March 2nd
|Jülich Research Centre (Germany)
|R. Dunin-Borkowski, J. Mayer, and K. Tillmann
|ultramacron vol 1 (2012)