on the Development and Application of Focused Ion Beams
Registration
Participation is subject to abstract approval.
Participation Fee: 300€
The number of participants is limited to 15.
APPLICATION PROCESS
Please submit your abstract before September 20th, 2026 using the form provided below.
Our scientific review committee will check your contribution and you will be informed whether you are eligible to attend until September 25th, 2026 the latest.
If your participation was approved, you will receive a request for registration. This has to be finished within 1 week after reception. Due to very strict security regulations on the research center Jülich campus, access can only be granted if all requested information is provided in time.
ABSTRACTS
Your abstract must have a minimum length of 1000 characters. Maximum length is 2000 characters. You can add one figure which is optional. But if a figure is provided adding an image caption is mandatory.
In your abstract, describe the most ambitious FIB-related experiment you can envision. The concept may be highly innovative or unconventional, but it should remain grounded in physical feasibility. We encourage bold, creative ideas that push the boundaries of what could realistically be achieved using focused ion beam technologies.
