Dr. Probe

HR(S)TEM image simulation package


 

Follow these examples of image simulations for learning how to use the Dr. Probe software. They may also serve as templates for your own simulations.

 

1. M. Bar-Sadan et al., “Direct Imaging of Single Au Atoms in GaAs Nanowires”, Nano Lett. 12 (2012) 2352-2356. [doi]  

 

2. J. Barthel, “Time-efficient frozen phonon multislice calculations for image simulations in high-resolution STEM”, Proc. of the 15th Euro. Microsc. Cong. (2012). [weblink]  

 

3. C.L. Jia et al., “Atomic-Scale Measurement of Structure and Chemistry of a Single-Unit-Cell Layer of LaAlO3 Embedded in SrTiO3“, Microscopy and Microanalysis 19 (2013) 310-318. [doi]  

 

4. D.G. Stroppa et al., “Assessment of a nanocrystal 3-D morphology by the analysis of single HAADF-HRSTEM images”, Nanoscale Research Letters 8 (2013) 475. [doi]  

 

5. M. Heidelmann et al., “Periodic Cation Segregation in Cs0.44[Nb2.54W2.46O14] Quantified by High-Resolution Scanning Transmission Electron Microscopy”, Microscopy and Microanalysis 20 (2014) 1453-1462. [doi]  

 

6. D.G. Stroppa et al., “Analysis of Dopant Atom Distribution and Quantification of Oxygen Vacancies on Individual Gd-Doped CeO2 Nanocrystals”, Chemistry – A European Journal 22 (2014) 6288-6293. [doi]  

 

7. C.L. Jia et al., “Determination of the 3D shape of a nanoscale crystal with atomic resolution from a single image”, Nature Materials 13 (2014) 1044-1049. [doi]  

 

8. S.G. Wolf, L. Houben, M. Elbaum, “Cryo-scanning transmission electron tomography of vitrified cells”, Nature Methods 11 (2014) 423-428. [doi]  

 

9. I. MacLaren et al., “On the origin of differential phase contrast at a locally charged and globally charge-compensated domain boundary in a polar-ordered material”, Ultramicroscopy 154 (2015) 57-63. [doi]  

 

10. H. Du et al., “Atomic Structure of Antiphase Nanodomains in Fe-Doped SrTiO3 Films”, Adv. Funct. Mater. 25 (2015) 6369-6373. [doi]  

 

11. A. Stoffers et al., “Complex Nanotwin Substructure of an Asymmetric Σ9 Tilt Grain Boundary in a Silicon Polycrystal”, Phys. Rev. Lett. 115 (2015) 235502. [doi]  

 

12. J.M. Salih et al., “Maghemite-like regions at the crossing of two antiphase boundaries in doped BiFeO3“, Mat. Sci. Tech. 32 (2016) 242-247. [doi]  

 

13. L.S. Panchakarla et al., “Strontium cobalt oxide misfit nanotubes”, Chem. Mat. 28 (2016) 9150-9157. [doi]  

 

14. L. Jin et al., “Surface reconstructions and related local properties of a BiFeO3 thin films”, Sci. Rep. 7 (2017) 39698. [doi]  

 

15. S. Borghardt et al., “Quantitative Agreement between Electron-Optical Phase Images of WSe2 and Simulations Based on Electrostatic Potentials that Include Bonding Effects”, Phys. Rev. Lett. 118 (2017) 086101. [doi]  

 

16. H. Du et al., “Nanosized Conducting Filaments Formed by Atomic-Scale Defects in Redox-Based Resistive Switching Memories”, Chem. Mater. 29 (2017) 3164-3173. [doi]  

 

17. F. Winkler et al., “Quantitative measurement of mean inner potential and specimen thickness from high-resolution off-axis electron holograms of ultra-thin layered WSe2“, Ultramicroscopy 176 (2017) 99-107. [doi]  

 

18. L. Jin et al., “Atomic resolution imaging of YAlO3:Ce in the chromatic and spherical aberration corrected PICO electron microscope”, Ultramicroscopy 178 (2017) 38-47. [doi]  

 

19. Y.T. Chen et al., “Nanometre-scale 3D defects in Cr2AlC thin films”, Scientific Reports 7 (2017) 984. [doi]  

 

20. J.E. Kleibeuker et al., “Route to achieving perfect B-site ordering in double perovskite thin films”, NPG Asia Materials 9 (2017) e406. [doi]  

 

21. H. Zhao et al., “Elucidating structural order and disorder phenomena in mullite-type Al4B2O9 by automated electron diffraction tomography”, J. Sol. State Chem. 249 (2017) 114-123. [doi]  

 

22. A. Bashir et al., “Interfacial sharpness and intermixing in a Ge-SiGe multiple quantum well structure”, J. Appl. Phys. 123 (2018) 035703. [doi]  

 

23. F. Winkler et al., “Absolute Scale Quantitative Off-Axis Electron Holography at Atomic Resolution”, Phys. Rev. Lett. 120 (2018) 156101. [doi]  

 

24. J. Barthel, “Dr. Probe: A software for high-resolution STEM image simulation”, Ultramicroscopy 193 (2018) 1-11. [doi]  

 

25. S. Myeong et al., “Understanding voltage decay in lithium-excess layered cathode materials through oxygen-centred structural arrangement”, Nature Communications 9 (2018) 3285. [doi]  

 

26. Q.D. Truong et al., “Inversion domain boundaries in MoSe2 layers”, RSC Adv. 8 (2018) 33391-33397. [doi]  

 

27. I. Hilmi et al., “Influence of substrate dimensionality on the growth mode of epitaxial 3D-bonded GeTe thin films: From 3D to 2D growth”, Materials and Design 168 (2019) 107657. [doi]