This executable notebook for the commercial software “Mathematica” from Wolfram Research Ltd. is to be used for the calculation of diffraction contrast images associated with overpressurized crack-shaped inclusions. The notebook is only intended for use with Mathematica Version 3.x using MAC-OS 8.1 or higher. After downloading the notebook, extract the file dcisim.sit. A brief description of all relevant parameters for the calcualation of two-dimensional images as well as one-dimension intensity line scans is given at the beginning of the notebook. Adjustable parameters are labelled in red. Default settings assume the excitation of an (004) beam and silicon material properties.
Tillmann, K., Hüging, N., Trinkaus, H., & Luysberg, M. (2004). Quantitative Transmission Electron Microscopy Analysis of the Pressure of Helium-Filled Cracks in Implanted Silicon. Microscopy and Microanalysis, 10(2), 199-214. doi:10.1017/S1431927604040024