The ER-C Material Science Facility houses conventional and state-of-the-art electron microscopes, ranging from standard scanning electron microscopes to highly-specialised aberration corrected instruments offering sub-Å resolution imaging and spectroscopy, as well as quantitative measurements of electromagnetic field distributions using phase contrast techniques that include off-axis electron holography and 4D STEM.
TFS Spectra 300
The TFS Spectra 300 is a state-of-the-art FEG Scanning Transmission Electron Microscope (S/TEM) with a high-tension voltage range of 30 kV – 300 kV. Thanks to its specially designed enclosure it is not only possible to transfer information well below 1 Å resolution, it also allows the system to easily reach ultra-high resolution routinely in a noisier environment.
FEI Titan G3 50-300 PICO
FEI (now ThermoFisher) Titan G3 50-300 PICO The FEI (now ThermoFisher) Titan G3 50-300 PICO is a unique fourth generation transmission electron microscope which has been specifically designed for the…
The Hitachi HF5000 is a (scanning) transmission electron microscope designed to unravel solid-state phenomena at the atomic scale. By combining high special resolution and analytical capabilities with a gas inlet system and a variety of in situ holders, structural and compositional changes of a broad range of materials can be revealed at the atomic level.
FEI Titan G2 60-300 HOLO
A fourth-generation transmission electron microscope specifically designed for off-axis electron holography. Equipped with a Lorentz lens and two electron biprisms…
The Tescan Tensor STEM is an integrated analytical precession-assisted 4D-STEM instrument for multimodal characterization of nanoscale morphological, chemical, structural and crystallographic properties of a wide range of materials systems.
FEI Titan G2 80-200 ChemiSTEM
Fourth-generation Cs-probe corrected instrument with Super-X detector and dual EELS energy filter, allowing simultaneous EDX and EELS read-out of 1000 spectra per second…
FEI Helios NanoLab 400S FIB-SEM
One of the world’s most advanced DualBeamTM FIB platforms optimised for high throughput high-resolution S/TEM sample preparation, SEM imaging, process development and control…
The ER-C provides both, direct services and scientific assistance to university research groups and research laboratories in industry and academia in the field of advanced electron microscopic applications. The support of students is also an integral part of our activities.
FEI Helios NanoLab 460F1 FIB-SEM
A highly advanced dual-beam FIB-SEM platform for imaging and analytical measurements, TEM sample and atom-probe needle preparation, process development and process control…
FEI Titan 80-300 STEM
Cs probe-corrected scanning transmission electron microscope equipped with a post-column energy filter, offering a STEM resolution of 80 pm at 300 kV…
FEI Tecnai G2 F20
A versatile instrument for TEM or STEM imaging, equipped with post-column Gatan image filter, high-angle X-ray detector and a Nanomegas electron-precession system…
FEI Titan 80-300 TEM
Cs-corrected high-resolution transmission electron microscope equipped with a piezo-stage for ultra-precise 3D specimen positioning and an information limit well below 100 pm…