{"id":7171,"date":"2023-07-20T14:20:15","date_gmt":"2023-07-20T14:20:15","guid":{"rendered":"https:\/\/er-c.org\/?page_id=7171"},"modified":"2023-08-10T09:53:37","modified_gmt":"2023-08-10T09:53:37","slug":"sample-preparation","status":"publish","type":"page","link":"https:\/\/er-c.org\/index.php\/facilities-2\/facilities-material-science\/sample-preparation\/","title":{"rendered":"Sample Preparation"},"content":{"rendered":"\n
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\n\t\t\t\t\t\tSample Preparation\t\t\t\t\t\t<\/h1>\n\t\t\t\t\t\t<\/div>\n<\/div>\n\n\n
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Specimen preparation for the transmission electron microscopy is an unavoidable and critical step for any TEM experiments. It is frequently a very challenging task, which may decide about the success or fail of arduously planned TEM experiment. All of the existing methods for the TEM-specimen preparation follow one common principle \u2013 the thinner, the better, which means that the thickness of the TEM-specimen ideally should not exceed 100 nm (10nm for HRTEM). Furthermore, a high quality ultra-thin TEM-specimen should not only reflect the material properties on the nm scale, but also have a homogeneous and clean surface to avoid the measurement artefacts.<\/p>\n\n\n\n

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Conventional Sample Preparation<\/h3>\n\t\t\t\t