the er-c
fei tecnai g2 f20 @er-c

The Tecnai G2 F20 is a versatile field emission transmission electron microscope ideally suited for studying a wide range of general and advanced solid state materials. This analytical instrument, which is equipped with a compustage-driven side-entry double-tilt goniometer stage and an assortment of specimen holders, is optimised for imaging at medium resolution or for performing elemental microanalysis.

Electron energy loss spectroscopy (EELS), energy dispersive X-ray (EDX), and high angle annular darkfield (HAADF) signals for elemental microanalysis or spectral imaging can be collected either separately or simultaneously. Diffraction modes include convergent beam diffraction for three-dimensional structure information and micro-diffraction with a minimum probe size of 4 nm.

For these purposes, the instrument is equipped with an EDAX r-TEM SUTW detector and a Gatan Tridiem 863P spectrometer coupled to integrated computer systems running analytical software. This system can acquire and quantify EDX and EELS spectra to generate elemental maps and perform microstructural imaging.

External users planning to use this instrument should consult Martina Luysberg or Marc Heggen.

Users of the Tecnai G2 F20 are kindly asked to quote a tecnical description of the instrument published in the Journal of large-scale research facilities 2 (2016) A77. when referring to the use of this instrument in publications.

  • Acceleration Voltage:
120 kV ... 200 kV
  • TEM – Point to Point Resolution at 200 kV
2.4 Å
  • TEM – Information Limit at 200 kV
1.4 Å
  • TEM – Objective Lens Cs
1.2 mm
  • TEM – Objective Lens Cc
1.2 mm
  • TEM – Magnification Range
25 kx ... 1030 kx
  • STEM – HAADF Resolution
1.9 Å
  • STEM – Probe Cs
1.2 mm
  • STEM – Probe Cc
1.2 mm
  • STEM – Magnification Range
150x ... 230 Mx
  • Gatan UltraScan 1000P (2k x 2k) charge coupled digital camera equipped with a standard phosphor scintillator.
  • Gatan Tridiem 863P post column image filter (GIF) with fully 2nd order and partially 3rd order corrected prisms yielding a total system energy resolution of 0.65 eV or better at a maximum field of view of 15 µm for imaging and 100 mR for diffraction analyses.
  • High angle energy dispersive X-ray detector with a resolution of 136 eV or better for Mn K-alpha radiation.High angle energy dispersive X-ray detector with a resolution of 136 eV for Mn K-alpha radiation.
specimen stages
  • FEI Single Tilt
± 60°
  • FEI Double Tilt
± 40°

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